Physical properties inside domain walls: Basic principles and scanning probe measurements

This chapter explains that the field of domain wall (DW) nanoelectronics is predicated on the premise that the distinct physical properties of domain walls offer new conceptual possibilities for devices. It first deals with basic physics of domain wall properties, and in particular the cross-coupling that allows domain walls to display properties and order parameters different from those of the parent bulk material. The chapter then turns to scanning probe techniques for measuring some of these domain wall properties, and specifically atomic force microscopy (AFM). Together with transmission electron microscopy, AFM is one of the most important tools currently available to probe and manipulate the individual position and physical properties of domain walls. Finally, the chapter focuses on two recent developments that allow investigating hitherto overlooked properties of domain walls: their magnetotransport and their mechanical response.