Abstract
A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.
Original language | English |
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Pages (from-to) | 1515-1517 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 56 |
Issue number | 16 |
DOIs | |
State | Published - 1990 |
Externally published | Yes |