Abstract
Pulsed ArF (193 nm) excimer laser photolysis of disilane, germane, and disilane-ammonia mixtures has been used to deposit amorphous superlattices containing silicon, germanium, and silicon nitride layers. Transmission electron microscope cross-section views demonstrate that structures having thin (5-25 nm) layers and sharp interlayer boundaries can be deposited at substrate temperatures below the pyrolytic threshold, entirely under laser photolytic control.
| Original language | English |
|---|---|
| Pages (from-to) | 1868-1870 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 52 |
| Issue number | 22 |
| DOIs | |
| State | Published - 1988 |
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