Photon-controlled fabrication of amorphous superlattice structures using ArF (193 nm) excimer laser photolysis

  • D. H. Lowndes
  • , D. B. Geohegan
  • , D. Eres
  • , S. J. Pennycook
  • , D. N. Mashburn
  • , G. E. Jellison

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Pulsed ArF (193 nm) excimer laser photolysis of disilane, germane, and disilane-ammonia mixtures has been used to deposit amorphous superlattices containing silicon, germanium, and silicon nitride layers. Transmission electron microscope cross-section views demonstrate that structures having thin (5-25 nm) layers and sharp interlayer boundaries can be deposited at substrate temperatures below the pyrolytic threshold, entirely under laser photolytic control.

Original languageEnglish
Pages (from-to)1868-1870
Number of pages3
JournalApplied Physics Letters
Volume52
Issue number22
DOIs
StatePublished - 1988

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