Abstract
Photoelectron spectral peaks derived from bulk band-to-band transitions contain information on band structure and quasiparticle lifetime. However, the lineshapes can be significantly distorted by surface photoemission and final-state broadening. The latter is often a dominant source of peak width and may be strongly dependent on the experimental geometry. The use of a thin film sample provides an alternate method of resolving k and removes the dependence on the matrix element and final states from the measurement. Many thin film systems display quantum-well peaks in their photoemission spectra, but in the typical case, the line widths are dominated by interfacial and surface roughness. It has been demonstrated that films that are atomically uniform over the area used for measurement can be grown. In such films broadening due to roughness is eliminated, and the observed peak widths are directly related to the quasiparticle lifetime. The film behaves like an optical interferometer. Imperfection of this interferometer, such as scattering or leakage at the boundaries, introduces additional broadening, but this contribution can be accounted for using a Fabry-Pérot analysis. Quantum-well peaks derived from the sp band can be resolved in films of Ag on Fe(100) to thicknesses in excess of 100 ML. Application of the Fabry-Pérot model to data covering a large thickness range yields an accurate band-structure determination, quasiparticle lifetimes, as well as properties of the well including the interfacial reflectivity and phase shift. Through a study of the temperature dependence of the spectra, the contribution to the lifetime width due to phonon scattering can be determined. This results in a value for the electron-phonon mass-enhancement parameter λ. The observation of quantum well states is not limited to sp-derived states: the Ag d bands also provide discrete states, although the range of film thicknesses over which they are observable is more limited than for the sp-derived states.
Original language | English |
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Pages (from-to) | 413-432 |
Number of pages | 20 |
Journal | Journal of Electron Spectroscopy and Related Phenomena |
Volume | 117-118 |
DOIs | |
State | Published - Jun 2001 |
Externally published | Yes |
Funding
The authors wish to thank present and former group members Dah-An Luh, J. J. Paggel, W. E. McMahon, E. D. Hansen, M. A. Mueller, G. E. Franklin, A. Samsavar, A. L. Wachs, A. P. Shapiro, and T. C. Hsieh for their contributions to the work presented here. Much of the material presented here is based upon work supported by the U. S. National Science Foundation, under Grant Nos. DMR-99-75470 and DMR-99-75182. An acknowledgment is made to the Donors of the Petroleum Research Fund, administered by the American Chemical Society, and to the U. S. Department of Energy, Division of Materials Sciences, (Grant No. DEFG02-91ER45439) for partial support of the synchrotron beamline operation and for support of the central facilities of the Frederick Seitz Materials Research Laboratory. The Synchrotron Radiation Center of the University of Wisconsin is supported by the National Science Foundation under Grant No. DMR-95-31009.
Funders | Funder number |
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U. S. Department of Energy | |
U. S. National Science Foundation | |
National Science Foundation | |
American Chemical Society | |
Division of Materials Sciences and Engineering |
Keywords
- Photoemission lineshapes
- Quantum wells
- Quasiparticle lifetimes
- Thin films