Photocathode roughness impact on photogun beam characteristics

A. M. Tron; T. Gorlov

Photocathode roughness impact on photogun beam characteristics

Research output: Contribution to conference › Paper › peer-review

5 Scopus citations

Abstract

Photocathode surface roughness has an impact on bunch duration, beam emittance at the exit of femtosecond photogun with an accelerating field that is considered in assumption of quasistationary one in the paper. The main problem in the investigation of the impact is determination of the field near the surface, statistical properties of which are defined in terms of the rms values of deviation and slope in profile line of the surface roughness. The results of the investigations, performed for the rms deviation and slope of roughness within respectively 1 - 500 nm and 2 - 20 degrees, are presented and discussed.

Original language	English
Pages	121-123
Number of pages	3
State	Published - 2006
Externally published	Yes
Event	10th European Particle Accelerator Conference, EPAC 2006 - Edinburgh, United Kingdom Duration: Jun 26 2006 → Jun 30 2006

Conference

Conference	10th European Particle Accelerator Conference, EPAC 2006
Country/Territory	United Kingdom
City	Edinburgh
Period	06/26/06 → 06/30/06

Cite this

@conference{851f89b3157e4904995cbfd5c74ae572,

title = "Photocathode roughness impact on photogun beam characteristics",

abstract = "Photocathode surface roughness has an impact on bunch duration, beam emittance at the exit of femtosecond photogun with an accelerating field that is considered in assumption of quasistationary one in the paper. The main problem in the investigation of the impact is determination of the field near the surface, statistical properties of which are defined in terms of the rms values of deviation and slope in profile line of the surface roughness. The results of the investigations, performed for the rms deviation and slope of roughness within respectively 1 - 500 nm and 2 - 20 degrees, are presented and discussed.",

author = "Tron, {A. M.} and T. Gorlov",

year = "2006",

language = "English",

pages = "121--123",

note = "10th European Particle Accelerator Conference, EPAC 2006 ; Conference date: 26-06-2006 Through 30-06-2006",

}

TY - CONF

T1 - Photocathode roughness impact on photogun beam characteristics

AU - Tron, A. M.

AU - Gorlov, T.

PY - 2006

Y1 - 2006

N2 - Photocathode surface roughness has an impact on bunch duration, beam emittance at the exit of femtosecond photogun with an accelerating field that is considered in assumption of quasistationary one in the paper. The main problem in the investigation of the impact is determination of the field near the surface, statistical properties of which are defined in terms of the rms values of deviation and slope in profile line of the surface roughness. The results of the investigations, performed for the rms deviation and slope of roughness within respectively 1 - 500 nm and 2 - 20 degrees, are presented and discussed.

AB - Photocathode surface roughness has an impact on bunch duration, beam emittance at the exit of femtosecond photogun with an accelerating field that is considered in assumption of quasistationary one in the paper. The main problem in the investigation of the impact is determination of the field near the surface, statistical properties of which are defined in terms of the rms values of deviation and slope in profile line of the surface roughness. The results of the investigations, performed for the rms deviation and slope of roughness within respectively 1 - 500 nm and 2 - 20 degrees, are presented and discussed.

UR - http://www.scopus.com/inward/record.url?scp=84898811172&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:84898811172

SP - 121

EP - 123

T2 - 10th European Particle Accelerator Conference, EPAC 2006

Y2 - 26 June 2006 through 30 June 2006

ER -

Photocathode roughness impact on photogun beam characteristics

Abstract

Conference

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