Performance studies of CdZnTe detector by using a pulse shape analysis

A. E. Bolotnikov, G. S. Camarda, G. A. Carini, M. Fiederle, L. Li, G. W. Wright, R. B. James

Research output: Contribution to journalConference articlepeer-review

21 Scopus citations

Abstract

Pulse shape analysis is proved to be a powerful tool to characterize the performance of CdZnTe devices and understand their operating principles. It allows one to investigate the device configurations, electron transport properties, effects governing charge collection, electric-field distributions, signal charge formation, etc. This work describes an application of different techniques based on the pulse shape measurements to characterize pixel, coplanar-grid, and virtual Frisch-grid devices and understand the electronic properties of CZT material provided by different vendors. We report new results that may explain the performance limits of these devices.

Original languageEnglish
Article number59220K
Pages (from-to)1-12
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5922
DOIs
StatePublished - 2005
EventHard X-Ray and Gamma-Ray Detector Physics VII - San Diego, CA, United States
Duration: Aug 1 2005Aug 3 2005

Keywords

  • CdZnTe
  • Gamma ray detectors
  • Pulse-shape analysis

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