Performance of a silicon-drift detector in 200kv tem environments

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1 Scopus citations

Original language	English
Pages (from-to)	228-229
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609099061
State	Published - Jul 2009

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title = "Performance of a silicon-drift detector in 200kv tem environments",

author = "Allard, \{L. F.\} and Rozeveld, \{S. J.\}",

year = "2009",

month = jul,

doi = "10.1017/S1431927609099061",

language = "English",

volume = "15",

pages = "228--229",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Performance of a silicon-drift detector in 200kv tem environments

AU - Allard, L. F.

AU - Rozeveld, S. J.

PY - 2009/7

Y1 - 2009/7

UR - https://www.scopus.com/pages/publications/69949171590

U2 - 10.1017/S1431927609099061

DO - 10.1017/S1431927609099061

M3 - Article

AN - SCOPUS:69949171590

SN - 1431-9276

VL - 15

SP - 228

EP - 229

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -