Original language | English |
---|---|
Pages (from-to) | 228-229 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 15 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Jul 2009 |
Performance of a silicon-drift detector in 200kv tem environments
L. F. Allard, S. J. Rozeveld
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations