Performance and stability of dedicated aberration-corrected STEMs: A user's perspective

  • D. M. Kepaptsoglou
  • , A. R. Lupini
  • , D. Mücke-Herzberg
  • , G. Vaughan
  • , Q. M. Ramasse

    Research output: Contribution to journalConference articlepeer-review

    Original languageEnglish
    Pages (from-to)924-925
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume20
    Issue number3
    DOIs
    StatePublished - Aug 1 2014
    EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
    Duration: Aug 3 2014Aug 7 2014

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