Performance and stability of dedicated aberration-corrected STEMs: A user's perspective

D. M. Kepaptsoglou; A. R. Lupini; D. Mücke-Herzberg; G. Vaughan; Q. M. Ramasse

doi:10.1017/S1431927614006345

Performance and stability of dedicated aberration-corrected STEMs: A user's perspective

D. M. Kepaptsoglou, A. R. Lupini, D. Mücke-Herzberg, G. Vaughan, Q. M. Ramasse

electron Microscopy and Microanalysis

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	924-925
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614006345
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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author = "Kepaptsoglou, {D. M.} and Lupini, {A. R.} and D. M{\"u}cke-Herzberg and G. Vaughan and Ramasse, {Q. M.}",

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T2 - Microscopy and Microanalysis 2014, M and M 2014

AU - Kepaptsoglou, D. M.

AU - Lupini, A. R.

AU - Mücke-Herzberg, D.

AU - Vaughan, G.

AU - Ramasse, Q. M.

PY - 2014/8/1

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U2 - 10.1017/S1431927614006345

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M3 - Conference article

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

Y2 - 3 August 2014 through 7 August 2014

ER -

Performance and stability of dedicated aberration-corrected STEMs: A user's perspective

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