Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS

Mary Bliss; David C. Gerlach; John B. Cliff; Mychailo B. Toloczko; Debra S. Barnett; Guido Ciampi; Kelly A. Jones; Kelvin G. Lynn

doi:10.1016/j.nima.2007.04.018

Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS

Mary Bliss, David C. Gerlach, John B. Cliff, Mychailo B. Toloczko, Debra S. Barnett, Guido Ciampi, Kelly A. Jones, Kelvin G. Lynn

Applied Materials Analysis

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.

Original language	English
Pages (from-to)	138-140
Number of pages	3
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	579
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2007.04.018
State	Published - Aug 21 2007

Funding

This work is supported by NNSA NA-22 Office of Non-Proliferation Research and Engineering. Pacific Northwest National Laboratory is operated by the Battelle Memorial Institute for the US Department of Energy under Contract DE-AC05-76RLO-1830.

Access to Document

10.1016/j.nima.2007.04.018

Cite this

Bliss, M., Gerlach, D. C., Cliff, J. B., Toloczko, M. B., Barnett, D. S., Ciampi, G., Jones, K. A., & Lynn, K. G. (2007). Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 579(1), 138-140. https://doi.org/10.1016/j.nima.2007.04.018

@article{0aa9f1561f2949c09339ea72a223d6e0,

title = "Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS",

abstract = "High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.",

author = "Mary Bliss and Gerlach, {David C.} and Cliff, {John B.} and Toloczko, {Mychailo B.} and Barnett, {Debra S.} and Guido Ciampi and Jones, {Kelly A.} and Lynn, {Kelvin G.}",

year = "2007",

month = aug,

day = "21",

doi = "10.1016/j.nima.2007.04.018",

language = "English",

volume = "579",

pages = "138--140",

journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier",

number = "1",

}

Bliss, M, Gerlach, DC, Cliff, JB, Toloczko, MB, Barnett, DS, Ciampi, G, Jones, KA & Lynn, KG 2007, 'Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 579, no. 1, pp. 138-140. https://doi.org/10.1016/j.nima.2007.04.018

Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS. / Bliss, Mary; Gerlach, David C.; Cliff, John B. et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 579, No. 1, 21.08.2007, p. 138-140.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS

AU - Bliss, Mary

AU - Gerlach, David C.

AU - Cliff, John B.

AU - Toloczko, Mychailo B.

AU - Barnett, Debra S.

AU - Ciampi, Guido

AU - Jones, Kelly A.

AU - Lynn, Kelvin G.

PY - 2007/8/21

Y1 - 2007/8/21

N2 - High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.

AB - High-resistivity crystals of CdZnTe are made using low-pressure Bridgman. The success of any doping scheme depends on its effectiveness in overcoming trace contamination and variations in processing. Multiple imaging and quantitative techniques gave highly complimentary information relating to spatial heterogeneity of the cadmium zinc telluride (CZT). Secondary Ion Mass Spectroscopy (SIMS) has good sensitivity and can quantitate trace elements in areas less than 150 μm in diameter. PNNL has SIMS standards for several key elements and can extrapolate for other elements. A heavily Pb-doped sample (0.1 atm%) was characterized to determine the distribution of lead and its potential impact on precipitates.

UR - http://www.scopus.com/inward/record.url?scp=34547673614&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2007.04.018

DO - 10.1016/j.nima.2007.04.018

M3 - Article

AN - SCOPUS:34547673614

SN - 0168-9002

VL - 579

SP - 138

EP - 140

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 1

ER -

Pb quantification of CdZnTe microheterogeneities complimented by SEM, IR microscopy, EDX, and TOF-SIMS

Abstract

Funding

Access to Document

Other files and links

Fingerprint

Cite this