Path-separated electron interferometry in a scanning transmission electron microscope

Fehmi S. Yasin; Tyler R. Harvey; Jordan J. Chess; Jordan S. Pierce; Benjamin J. McMorran

doi:10.1088/1361-6463/aabc47

Path-separated electron interferometry in a scanning transmission electron microscope

Fehmi S. Yasin, Tyler R. Harvey, Jordan J. Chess, Jordan S. Pierce, Benjamin J. McMorran

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the +1 diffraction order probe through amorphous carbon while passing the 0th and -1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.

Original language	English
Article number	205104
Journal	Journal of Physics D: Applied Physics
Volume	51
Issue number	20
DOIs	https://doi.org/10.1088/1361-6463/aabc47
State	Published - Apr 26 2018
Externally published	Yes

Funding

This material is based upon work supported by the National Science Foundation Graduate Research Fellowship Program under Grant No. 1309047. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. The authors wish to thank Josh Razink of the CAMCOR High Resolution and Analytical facility at University of Oregon for instrument support. We gratefully acknowledge the use of CAMCOR facilities, which have been purchased with a combination of federal and state funding. This work was also supported by the US Department of Energy, Office of Science, Basic Energy Sciences, under Award DE-SC0010466.

Funders	Funder number
US Department of Energy
National Science Foundation
Directorate for Education and Human Resources	1309047
Office of Science
Basic Energy Sciences	DE-SC0010466

Keywords

electron holography
electron interferometry
electron microscopy
scanning transmission electron microscopy

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10.1088/1361-6463/aabc47

Cite this

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title = "Path-separated electron interferometry in a scanning transmission electron microscope",

abstract = "We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the +1 diffraction order probe through amorphous carbon while passing the 0th and -1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.",

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AU - Yasin, Fehmi S.

AU - Harvey, Tyler R.

AU - Chess, Jordan J.

AU - Pierce, Jordan S.

AU - McMorran, Benjamin J.

PY - 2018/4/26

Y1 - 2018/4/26

N2 - We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the +1 diffraction order probe through amorphous carbon while passing the 0th and -1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.

AB - We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the +1 diffraction order probe through amorphous carbon while passing the 0th and -1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.

KW - electron holography

KW - electron interferometry

KW - electron microscopy

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Path-separated electron interferometry in a scanning transmission electron microscope

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