Part identification using robust feature extraction and pattern classification

Martin A. Hunt, J. Steve Hicks, Shaun S. Gleason

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The approach presented in this work combines the high-speed nature of pixel-based processing with a standard feature-based classifier to obtain a fast, robust identification algorithm for artillery ammunition. The algorithm uses the Sobel kernel to estimate the vertical intensity gradient of an electronic image of a projectile's circumference. This operation is followed with a directed Hough transform at a theta of 0 degrees, resulting in a one-dimensional vector representing the magnitude and location of horizontal attributes. This sequence of operations generates a compact description of the attributes of interest which can be computed at high speed, has no threshold-based parameters, and is robust to degraded images. In the classification stage a fixed-length feature vector is generated by sampling the Hough vector at the spatial locations included in the union of attribute locations from each possible projectile type. The advantages of generating a feature set in this manner are that no high-level algorithms are necessary to detect the spatial location of attributes and the feature vector is compact. Features generated using this method have been used with a Mahalanobis distance, nearest mean classifier for the successful demonstration of a proof-of-concept system that automatically identifies 155 mm projectiles.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages219-230
Number of pages12
StatePublished - 1996
EventMachine Vision Applications in Industrial Inspection IV - San Jose, CA, USA
Duration: Jan 31 1996Feb 1 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2665
ISSN (Print)0277-786X

Conference

ConferenceMachine Vision Applications in Industrial Inspection IV
CitySan Jose, CA, USA
Period01/31/9602/1/96

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