Abstract
We present data in this paper which demonstrate that the luminescence efficiency of p-type ZnSe : N grown by molecular beam epitaxy using a remote RF plasma source is a strong function of doping concentration and that in moderately to heavily doped material (corresponding to NA - ND ≥ 2 × 1017 cm-3) significant concentrations of non-radiative recombination centers strongly limit the luminescence efficiency of the material. Such data were obtained by performing real-time, in situ cathodoluminescence intensity measurements during epilayer growth for variously doped epilayers.
| Original language | English |
|---|---|
| Pages (from-to) | 352-356 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 138 |
| Issue number | 1-4 |
| DOIs | |
| State | Published - Apr 2 1994 |
| Externally published | Yes |
Funding
The authors wish to thank Dr. James DePuydt and Mr. Gregory Meis-Haugen of the 3M Co. (St. Paul, MN) for providing the C-V data. The research has been financially supported by the National Science Foundation (Grant No. DMR-9116880) and by the Advanced Research Projects Agency (University Research Initiative Grant No. N-00014-92-J-1895).