Overlayer test of surface photoemission effect in Cu(100)

E. D. Hansen; T. Miller; T. C. Chiang

doi:10.1103/PhysRevLett.78.2807

Overlayer test of surface photoemission effect in Cu(100)

E. D. Hansen, T. Miller, T. C. Chiang

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Abstract

Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric sp direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.

Original language	English
Pages (from-to)	2807-2810
Number of pages	4
Journal	Physical Review Letters
Volume	78
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevLett.78.2807
State	Published - Apr 7 1997
Externally published	Yes

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10.1103/PhysRevLett.78.2807

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@article{e1a817f442a64537bfccb28a13579ac6,

title = "Overlayer test of surface photoemission effect in Cu(100)",

abstract = "Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric sp direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.",

author = "Hansen, {E. D.} and T. Miller and Chiang, {T. C.}",

year = "1997",

month = apr,

day = "7",

doi = "10.1103/PhysRevLett.78.2807",

language = "English",

volume = "78",

pages = "2807--2810",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "14",

}

TY - JOUR

T1 - Overlayer test of surface photoemission effect in Cu(100)

AU - Hansen, E. D.

AU - Miller, T.

AU - Chiang, T. C.

PY - 1997/4/7

Y1 - 1997/4/7

N2 - Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric sp direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.

AB - Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric sp direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.

UR - http://www.scopus.com/inward/record.url?scp=0031557578&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.78.2807

DO - 10.1103/PhysRevLett.78.2807

M3 - Article

AN - SCOPUS:0031557578

SN - 0031-9007

VL - 78

SP - 2807

EP - 2810

JO - Physical Review Letters

JF - Physical Review Letters

IS - 14

ER -

Overlayer test of surface photoemission effect in Cu(100)

Abstract

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