TY - GEN
T1 - Out-of-phase boundary (OPB) nucleation in layered oxides
AU - Zurbuchen, M. A.
AU - Lettieri, J.
AU - Jia, Y.
AU - Carim, A. H.
AU - Streiffer, S. K.
AU - Schlom, D. G.
PY - 2005
Y1 - 2005
N2 - Out-of-phase boundaries (OPBs), planar faults between regions of a crystal that are misaligned by a fraction of a unit cell dimension, occur frequently in materials of high structural anisotropy. Rarely observed in the bulk, OPBs frequently exist in epitaxial films of layered complex oxides, such as YBa 2Cu3O7-δ-type, Aurivillius, and Ruddlesden-Popper phases, and frequently propagate through the entire thickness of a film, due to their large offset and the improbability of opposite-sign OPB annihilation. OPBs have previously been demonstrated to have a significant impact upon properties, so it is important to understand their generation. These faults arise through the same few mechanisms in the various layered complex oxides. An effort is made to unify the discussion of nucleation of these defects, common to layered oxide materials. OPBs can nucleate at the film-substrate interface (primary) via steric, chemical, or misfit mechanisms, or post-growth (secondary) through crystallographic shear during decomposition of volatile components. Examples of the mechanisms observed during highresolution transmission electron microscopy (HRTEM) study of Aurivillius and RuddlesdenPopper phases are presented. A method for estimating the relative OPB density in a film from correlation of x-ray diffraction (XRD) θ-2θ data with TEM information on OPBs is presented.
AB - Out-of-phase boundaries (OPBs), planar faults between regions of a crystal that are misaligned by a fraction of a unit cell dimension, occur frequently in materials of high structural anisotropy. Rarely observed in the bulk, OPBs frequently exist in epitaxial films of layered complex oxides, such as YBa 2Cu3O7-δ-type, Aurivillius, and Ruddlesden-Popper phases, and frequently propagate through the entire thickness of a film, due to their large offset and the improbability of opposite-sign OPB annihilation. OPBs have previously been demonstrated to have a significant impact upon properties, so it is important to understand their generation. These faults arise through the same few mechanisms in the various layered complex oxides. An effort is made to unify the discussion of nucleation of these defects, common to layered oxide materials. OPBs can nucleate at the film-substrate interface (primary) via steric, chemical, or misfit mechanisms, or post-growth (secondary) through crystallographic shear during decomposition of volatile components. Examples of the mechanisms observed during highresolution transmission electron microscopy (HRTEM) study of Aurivillius and RuddlesdenPopper phases are presented. A method for estimating the relative OPB density in a film from correlation of x-ray diffraction (XRD) θ-2θ data with TEM information on OPBs is presented.
UR - http://www.scopus.com/inward/record.url?scp=34249951079&partnerID=8YFLogxK
U2 - 10.1557/proc-0902-t10-55
DO - 10.1557/proc-0902-t10-55
M3 - Conference contribution
AN - SCOPUS:34249951079
SN - 155899856X
SN - 9781558998568
T3 - Materials Research Society Symposium Proceedings
SP - 293
EP - 298
BT - Ferroelectric Thin Films XIII
PB - Materials Research Society
T2 - 2005 MRS Fall Meeting
Y2 - 28 November 2005 through 2 December 2005
ER -