Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Ouliana Panova; X. Chelsea Chen; Karen C. Bustillo; Colin Ophus; Mahesh P. Bhatt; Nitash Balsara; Andrew M. Minor

doi:10.1016/j.micron.2016.05.008

Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Ouliana Panova, X. Chelsea Chen, Karen C. Bustillo, Colin Ophus, Mahesh P. Bhatt, Nitash Balsara, Andrew M. Minor

Research output: Contribution to journal › Article › peer-review

62 Scopus citations

Abstract

We demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.

Original language	English
Pages (from-to)	30-36
Number of pages	7
Journal	Micron
Volume	88
DOIs	https://doi.org/10.1016/j.micron.2016.05.008
State	Published - Sep 1 2016
Externally published	Yes

Funding

Primary funding for the work was provided by the Electron Microscopy of Soft Matter Program from the Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231 . The electron microscopy was performed as a user project at the Molecular Foundry at Lawrence Berkeley National Laboratory, which is supported by the U.S. Department of Energy under Contract # DE-AC02-05CH11231 . We wish to thank Christoph Gammer for writing the custom scripts to drive the diffraction mapping acquisition.

Keywords

Crystal orientation
Diffraction
Locally resolved structure
P3HT
Polymers
STEM
Spatially resolved
TEM

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10.1016/j.micron.2016.05.008

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title = "Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction",

abstract = "We demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.",

keywords = "Crystal orientation, Diffraction, Locally resolved structure, P3HT, Polymers, STEM, Spatially resolved, TEM",

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T1 - Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

AU - Panova, Ouliana

AU - Chen, X. Chelsea

AU - Bustillo, Karen C.

AU - Ophus, Colin

AU - Bhatt, Mahesh P.

AU - Balsara, Nitash

AU - Minor, Andrew M.

PY - 2016/9/1

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N2 - We demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.

AB - We demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.

KW - Crystal orientation

KW - Diffraction

KW - Locally resolved structure

KW - P3HT

KW - Polymers

KW - STEM

KW - Spatially resolved

KW - TEM

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DO - 10.1016/j.micron.2016.05.008

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VL - 88

SP - 30

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JO - Micron

JF - Micron

ER -

Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction

Abstract

Funding

Keywords

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