Optimizing the tracking efficiency for cosmic ray muon tomography LA-UR-06-7556

J. A. Green, C. Alexander, T. Asaki, J. Bacon, G. Blanpied, K. Borozdin, A. Canabal-Rey, M. Cannon, R. Chartrand, D. Clark, C. Espinoza, E. Figueroa, A. Fraser, M. Galassi, J. Gomez, J. Gonzales, A. Green, N. Hengartner, G. Hogan, A. KlimenkoP. McGaughey, G. McGregor, J. Medina, C. Morris, K. Mosher, C. Oram, F. Pazuchanies, W. Priedhorsky, A. Sanchez, A. Saunders, R. Schirato, L. Schultz, M. Sossong, M. Sottile, J. Tenbrink, R. Van De Water, K. Vixie, B. Wohlberg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

20 Scopus citations

Abstract

We have built a detector capable of locating high Z objects in the sampling (middle) region of the detector. As atomic number increases, radiation length rapidly decreases, yielding larger variance in scattering angle. Cosmic ray muon tomography works by tracking muons above the sampling region, and tracking them below the region as well. The difference between the two trajectories yield information, via the muon scattering variance, of the materials contained within the sampling region[1]. One of most important aspects of cosmic ray tomography is minimizing exposure time. The cosmic ray flux is about 1/cm 2/min, and the goal is to use them for detecting high-density materials as quickly as possible. This involves using all of the information possible to reconstruct tracks with redundant detectors. Detector scattering residuals yield a low precision measurement of muon energy. Knowing the rough energy of an incoming particle will yield more precisely the expected scattering variance (currently the expectation value of ∼3GeV is used).

Original languageEnglish
Title of host publication2006 IEEE Nuclear Science Symposium - Conference Record
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages285-288
Number of pages4
ISBN (Print)1424405610, 9781424405619
DOIs
StatePublished - 2006
Event2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States
Duration: Oct 29 2006Nov 4 2006

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume1
ISSN (Print)1095-7863

Conference

Conference2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Country/TerritoryUnited States
CitySan Diego, CA
Period10/29/0611/4/06

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