Abstract
The illumination system of the cold field emission (CFE) TEM operates with a single condenser lens in normal imaging mode, and with a second condenser lens excited to give the ultra-fine 1 nm probe for microanalysis. The electron gun provides a guaranteed high brightness. An investigation is performed and other such claims, and report here some actual experimental results. This paper describes the optical characteristics of the Hitachi HF-2000 CFE TEM.
| Original language | English |
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| Pages (from-to) | 1076-1077 |
| Number of pages | 2 |
| Journal | Proceedings - Annual Meeting, Microscopy Society of America |
| State | Published - 1993 |
| Event | Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993 |