Abstract
Epitaxial crystallization of complex oxides provides the means to create materials with precisely selected composition, strain, and orientation, thereby controlling their functionalities. Extending this control to nanoscale three-dimensional geometries can be accomplished via a three-dimensional analog of oxide solid-phase epitaxy, lateral epitaxial crystallization. The orientation of crystals within laterally crystallized SrTiO3 systematically changes from the orientation of the SrTiO3 substrate. This evolution occurs as a function of lateral crystallization distance, with a rate of approximately 50° μm−1. The mechanism of the rotation is consistent with a steady-state stress of tens of megapascal over a 100–nanometer scale region near the moving amorphous/crystalline interface arising from the amorphous-crystalline density difference. Second harmonic generation and piezoelectric force microscopy reveal that the laterally crystallized SrTiO3 is noncentrosymmetric and develops a switchable piezoelectric response at room temperature, illustrating the potential to use lateral crystallization to control the functionality of complex oxides.
| Original language | English |
|---|---|
| Article number | eadk5509 |
| Journal | Science Advances |
| Volume | 10 |
| Issue number | 30 |
| DOIs | |
| State | Published - Jul 26 2024 |
Funding
This research was primarily supported by the NSF Division of Materials Research through the University of Wisconsin Materials Research Science and Engineering Center (grant DMR-1720415). The authors also gratefully acknowledge use of facilities and instrumentation supported by NSF through the University of Wisconsin Materials Research Science and Engineering Center (DMR-2309000). This work made use of the NUFAB and EPIC facilities of Northwestern University\u2019s NUANCE Center, which has received support from the SHyNE Resource (NSF ECCS-2025633), the IIN, and Northwestern\u2019s MRSEC program (NSF DMR-2308691). Work performed at the Center for Nanoscale Materials and Advanced Photon Source, both U.S. Department of Energy Office (DOE) of Science User Facilities, was supported by the U.S. DOE, Office of Basic Energy Sciences, under contract no. DE-AC02-06CH11357. Piezoresponse force microscopy measurements were conducted as part of a user project at the Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. This work is also supported by National Natural Science Foundation of China (NSFC) no. 52073155. Acknowledgments Funding: this research was primarily supported by the nSF division of Materials Research through the University of Wisconsin Materials Research Science and engineering center (grant dMR-1720415). the authors also gratefully acknowledge use of facilities and instrumentation supported by nSF through the University of Wisconsin Materials Research Science and engineering center (dMR-2309000). this work made use of the nUFAB and ePic facilities of northwestern University\u2019s nUANCE center, which has received support from the Shyne Resource (nSF eccS-2025633), the iin, and northwestern\u2019s MRSec program (nSF dMR-2308691). Work performed at the center for nanoscale Materials and Advanced Photon Source, both U.S. department of energy Office (dOe) of Science User Facilities, was supported by the U.S. dOe, Office of Basic energy Sciences, under contract no. de-Ac02-06ch11357. Piezoresponse force microscopy measurements were conducted as part of a user project at the center for nanophase Materials Sciences (cnMS), which is a U.S. department of energy, Office of Science User Facility at Oak Ridge national Laboratory. this work is also supported by national natural Science Foundation of china (nSFc) no. 52073155. Author contributions: conceptualization: Z.c., P.G.e., t.d.J., R.L., S.d.M., and d.e.S. Methodology: Z.c., P.G.e., M.h., t.d.J., R.L., S.L., S.d.M., d.e.S., and J.R.S. investigation: t.A., S.B., n.B., Z.c., P.G.e., M.h., X.h., t.d.J., n.K., K.P.K., Q.L., W.L., R.L., S.L., d.S.G., R.K.v., P.Z., and t.Z. visualization: S.B., P.G.e., X.h., t.d.J., K.P.K., Q.L., and R.L. Funding acquisition: P.G.e., R.L., and J.R.S. Project administration: Z.c., P.G.e., M.h., R.L., and J.R.S. Supervision: P.G.e., R.L., d.e.S., and J.R.S. Writing\u2014original draft: P.G.e., t.d.J., and R.L. Resources: n.B., P.G.e., Q.L., R.L., S.L., P.Z., and t.Z. validation: Z.c., t.d.J., R.L., J.R.S., and P.Z. Writing\u2014review and editing: S.B., Z.c., P.G.e., Q.L., R.L., d.e.S., and t.Z. data curation: R.L. Formal analysis: t.A., P.G.e., M.h., t.d.J., R.L., and J.R.S. Software: t.d.J., d.S.G., R.L., S.d.M., and t.Z. Competing interests: the authors declare that they have no competing interests. Data and materials availability: All data needed to evaluate the conclusions in the paper are present in the paper and/or the Supplementary Materials.