Operation of the Digital Electrostatic e-beam Array Lithography (DEAL) prototype with dose control

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations
Original languageEnglish
Title of host publicationTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07
Pages197-199
Number of pages3
DOIs
StatePublished - 2007
EventTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07 - Chicago, IL, United States
Duration: Jul 8 2008Jul 12 2008

Publication series

NameTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07

Conference

ConferenceTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07
Country/TerritoryUnited States
CityChicago, IL
Period07/8/0807/12/08

Cite this