One-minute nano-tomography using hard X-ray full-field transmission microscope

Mingyuan Ge; David Scott Coburn; Evgeny Nazaretski; Weihe Xu; Kazimierz Gofron; Huijuan Xu; Zhijian Yin; Wah Keat Lee

doi:10.1063/1.5048378

One-minute nano-tomography using hard X-ray full-field transmission microscope

Mingyuan Ge, David Scott Coburn, Evgeny Nazaretski, Weihe Xu, Kazimierz Gofron, Huijuan Xu, Zhijian Yin, Wah Keat Lee

Research output: Contribution to journal › Article › peer-review

76 Scopus citations

Abstract

Full field transmission X-ray microscopy (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time with the hard X-ray TXM at a synchrotron facility is >10 min for a 3D nano-tomography dataset with sub-50 nm spatial resolution. This is a significant limit on the types of 3D dynamics that can be investigated using this technique. Here, we present a demonstration of one-minute nano-tomography with sub-50 nm spatial resolution. This achievement is made possible with an in-house designed and commissioned TXM instrument at the Full-field X-ray Imaging beamline at the National Synchrotron Light Source-II at Brookhaven National Laboratory. This capability represents an order of magnitude decrease in the time required for studying sample dynamics with 10 s of nm spatial resolution.

Original language	English
Article number	083109
Journal	Applied Physics Letters
Volume	113
Issue number	8
DOIs	https://doi.org/10.1063/1.5048378
State	Published - Aug 20 2018
Externally published	Yes

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title = "One-minute nano-tomography using hard X-ray full-field transmission microscope",

abstract = "Full field transmission X-ray microscopy (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. However, to date, the typical acquisition time with the hard X-ray TXM at a synchrotron facility is >10 min for a 3D nano-tomography dataset with sub-50 nm spatial resolution. This is a significant limit on the types of 3D dynamics that can be investigated using this technique. Here, we present a demonstration of one-minute nano-tomography with sub-50 nm spatial resolution. This achievement is made possible with an in-house designed and commissioned TXM instrument at the Full-field X-ray Imaging beamline at the National Synchrotron Light Source-II at Brookhaven National Laboratory. This capability represents an order of magnitude decrease in the time required for studying sample dynamics with 10 s of nm spatial resolution.",

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AU - Ge, Mingyuan

AU - Coburn, David Scott

AU - Nazaretski, Evgeny

AU - Xu, Weihe

AU - Gofron, Kazimierz

AU - Xu, Huijuan

AU - Yin, Zhijian

AU - Lee, Wah Keat

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One-minute nano-tomography using hard X-ray full-field transmission microscope

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