On the uncertainty of lattice parameters refined from neutron diffraction data

B. Peplinski; D. M. Többens; W. Kockelmann; R. M. Ibberson

doi:10.1524/zksu.2006.suppl_23.21

On the uncertainty of lattice parameters refined from neutron diffraction data

B. Peplinski
, D. M. Többens
, W. Kockelmann
, R. M. Ibberson

Research output: Contribution to journal › Article › peer-review

Abstract

Factors crucial to the reliable estimation and minimization of the uncertainty of measurement of lattice parameters refined from neutron diffraction data are analysed. Estimates of the uncertainty of measurement are derived from diffraction data of a reference material collected at one constant wavelength and two time-of-flight neutron diffractometers.

Original language	English
Pages (from-to)	21-26
Number of pages	6
Journal	Zeitschrift fur Kristallographie, Supplement
Volume	1
Issue number	23
DOIs	https://doi.org/10.1524/zksu.2006.suppl_23.21
State	Published - 2006
Externally published	Yes

Keywords

Lattice parameter refinement
Neutron diffraction
Rietveld method
Uncertainty

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10.1524/zksu.2006.suppl_23.21

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title = "On the uncertainty of lattice parameters refined from neutron diffraction data",

abstract = "Factors crucial to the reliable estimation and minimization of the uncertainty of measurement of lattice parameters refined from neutron diffraction data are analysed. Estimates of the uncertainty of measurement are derived from diffraction data of a reference material collected at one constant wavelength and two time-of-flight neutron diffractometers.",

keywords = "Lattice parameter refinement, Neutron diffraction, Rietveld method, Uncertainty",

author = "B. Peplinski and T{\"o}bbens, \{D. M.\} and W. Kockelmann and Ibberson, \{R. M.\}",

year = "2006",

doi = "10.1524/zksu.2006.suppl\_23.21",

language = "English",

volume = "1",

pages = "21--26",

journal = "Zeitschrift fur Kristallographie, Supplement",

issn = "0930-486X",

publisher = "De Gruyter",

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TY - JOUR

T1 - On the uncertainty of lattice parameters refined from neutron diffraction data

AU - Peplinski, B.

AU - Többens, D. M.

AU - Kockelmann, W.

AU - Ibberson, R. M.

PY - 2006

Y1 - 2006

N2 - Factors crucial to the reliable estimation and minimization of the uncertainty of measurement of lattice parameters refined from neutron diffraction data are analysed. Estimates of the uncertainty of measurement are derived from diffraction data of a reference material collected at one constant wavelength and two time-of-flight neutron diffractometers.

AB - Factors crucial to the reliable estimation and minimization of the uncertainty of measurement of lattice parameters refined from neutron diffraction data are analysed. Estimates of the uncertainty of measurement are derived from diffraction data of a reference material collected at one constant wavelength and two time-of-flight neutron diffractometers.

KW - Lattice parameter refinement

KW - Neutron diffraction

KW - Rietveld method

KW - Uncertainty

UR - https://www.scopus.com/pages/publications/33846448739

U2 - 10.1524/zksu.2006.suppl_23.21

DO - 10.1524/zksu.2006.suppl_23.21

M3 - Article

AN - SCOPUS:33846448739

SN - 0930-486X

VL - 1

SP - 21

EP - 26

JO - Zeitschrift fur Kristallographie, Supplement

JF - Zeitschrift fur Kristallographie, Supplement

IS - 23

ER -

On the uncertainty of lattice parameters refined from neutron diffraction data

Abstract

Keywords

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