Abstract
Factors crucial to the reliable estimation and minimization of the uncertainty of measurement of lattice parameters refined from neutron diffraction data are analysed. Estimates of the uncertainty of measurement are derived from diffraction data of a reference material collected at one constant wavelength and two time-of-flight neutron diffractometers.
Original language | English |
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Pages (from-to) | 21-26 |
Number of pages | 6 |
Journal | Zeitschrift fur Kristallographie, Supplement |
Volume | 1 |
Issue number | 23 |
DOIs | |
State | Published - 2006 |
Externally published | Yes |
Keywords
- Lattice parameter refinement
- Neutron diffraction
- Rietveld method
- Uncertainty