TY - GEN
T1 - On condition monitoring of high frequency power GaN converters with adaptive prognostics
AU - Biglarbegian, Mehrdad
AU - Mostafavi, Saman
AU - Hauer, Sven
AU - Nibir, Shahriar Jalal
AU - Kim, Namwon
AU - Cox, Robert
AU - Parkhideh, Babak
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/4/18
Y1 - 2018/4/18
N2 - There is no doubt that in the future, a need for higher switching frequency is inevitable to extract the full benefits of reliable Gallium Nitride (GaN) device characteristics. Along with the reliability enhancement for GaN-based power converters, it is essential to monitor a precursor signature identification for diagnostics/prognostics techniques. With the availability of the most granular information deduced from advanced devices, a new data-driven scheme is proposed for system monitoring and possible lifetime extension of 400W power GaN converters at 100kHz. The approach relies on the real-time Rds(on) data extraction from the power converter, and calibration of an adaptive model using multi-physics co-simulations under thermal cycling. More specifically, the focus is on deploying machine learning algorithms to exploit for the parameter estimation in power electronics engineering reliability.
AB - There is no doubt that in the future, a need for higher switching frequency is inevitable to extract the full benefits of reliable Gallium Nitride (GaN) device characteristics. Along with the reliability enhancement for GaN-based power converters, it is essential to monitor a precursor signature identification for diagnostics/prognostics techniques. With the availability of the most granular information deduced from advanced devices, a new data-driven scheme is proposed for system monitoring and possible lifetime extension of 400W power GaN converters at 100kHz. The approach relies on the real-time Rds(on) data extraction from the power converter, and calibration of an adaptive model using multi-physics co-simulations under thermal cycling. More specifically, the focus is on deploying machine learning algorithms to exploit for the parameter estimation in power electronics engineering reliability.
KW - Fault prognostics
KW - High frequency dc-dc converter
KW - Internet of things
KW - Machine learning
KW - Metropolis-hasting
KW - Power GaN
KW - Reliability
KW - Wide bandgap semiconductors
UR - http://www.scopus.com/inward/record.url?scp=85046953924&partnerID=8YFLogxK
U2 - 10.1109/APEC.2018.8341180
DO - 10.1109/APEC.2018.8341180
M3 - Conference contribution
AN - SCOPUS:85046953924
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 1272
EP - 1279
BT - APEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018
Y2 - 4 March 2018 through 8 March 2018
ER -