On condition monitoring of high frequency power GaN converters with adaptive prognostics

Mehrdad Biglarbegian, Saman Mostafavi, Sven Hauer, Shahriar Jalal Nibir, Namwon Kim, Robert Cox, Babak Parkhideh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Scopus citations

Abstract

There is no doubt that in the future, a need for higher switching frequency is inevitable to extract the full benefits of reliable Gallium Nitride (GaN) device characteristics. Along with the reliability enhancement for GaN-based power converters, it is essential to monitor a precursor signature identification for diagnostics/prognostics techniques. With the availability of the most granular information deduced from advanced devices, a new data-driven scheme is proposed for system monitoring and possible lifetime extension of 400W power GaN converters at 100kHz. The approach relies on the real-time Rds(on) data extraction from the power converter, and calibration of an adaptive model using multi-physics co-simulations under thermal cycling. More specifically, the focus is on deploying machine learning algorithms to exploit for the parameter estimation in power electronics engineering reliability.

Original languageEnglish
Title of host publicationAPEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1272-1279
Number of pages8
ISBN (Electronic)9781538611807
DOIs
StatePublished - Apr 18 2018
Externally publishedYes
Event33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018 - San Antonio, United States
Duration: Mar 4 2018Mar 8 2018

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
Volume2018-March

Conference

Conference33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018
Country/TerritoryUnited States
CitySan Antonio
Period03/4/1803/8/18

Funding

ACKNOWLEDGMENT This research was supported by the National Science Foundation under Award No. 1610250. The authors would like to thank the Energy Production and Infrastructure Center (EPIC), and Electrical and Computer Engineering Department at the University of North Carolina at Charlotte. This research was supported by the National Science Foundation under Award No. 1610250. The authors would like to thank the Energy Production and Infrastructure Center (EPIC), and Electrical and Computer Engineering Department at the University of North Carolina at Charlotte.

FundersFunder number
National Science Foundation1610250
Ecumenical Project for International Cooperation
National Science Foundation

    Keywords

    • Fault prognostics
    • High frequency dc-dc converter
    • Internet of things
    • Machine learning
    • Metropolis-hasting
    • Power GaN
    • Reliability
    • Wide bandgap semiconductors

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