On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II

K. J. Gofron; Y. Q. Cai; D. S. Coburn; S. Antonelli; J. Flores; A. Suvorov

doi:10.1063/1.4952850

On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II

K. J. Gofron, Y. Q. Cai, D. S. Coburn, S. Antonelli, J. Flores, A. Suvorov

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

A novel on-axis X-ray microscope with 3 μm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.

Original language	English
Title of host publication	Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
Editors	Oleg Chubar, Ignace Jarrige, Konstantine Kaznatcheev, Lisa Miller, Eli Stavitski, Toshiya Tanabe, Timur Shaftan, Qun Shen, Ronald Pindak, Christie Nelson, Sebastian Kalbfleisch, Juergen Thieme, Garth Williams, Martin Fuchs, Abdul Rumaiz, Jun Wang, Kenneth Evans-Lutterodt, Wah-Keat Lee, Sean McSweeney, Elio Vescovo
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735413986
DOIs	https://doi.org/10.1063/1.4952850
State	Published - Jul 27 2016
Externally published	Yes
Event	12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 - New York, United States Duration: Jul 6 2015 → Jul 10 2015

Publication series

Name	AIP Conference Proceedings
Volume	1741
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
Country/Territory	United States
City	New York
Period	07/6/15 → 07/10/15

Funding

Work supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract No. DE-SC0012704. Thanks to Richard Green and David Levy for technical support.

Access to Document

10.1063/1.4952850

Cite this

Gofron, K. J., Cai, Y. Q., Coburn, D. S., Antonelli, S., Flores, J., & Suvorov, A. (2016). On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. In O. Chubar, I. Jarrige, K. Kaznatcheev, L. Miller, E. Stavitski, T. Tanabe, T. Shaftan, Q. Shen, R. Pindak, C. Nelson, S. Kalbfleisch, J. Thieme, G. Williams, M. Fuchs, A. Rumaiz, J. Wang, K. Evans-Lutterodt, W.-K. Lee, S. McSweeney, & E. Vescovo (Eds.), Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 Article 030027 (AIP Conference Proceedings; Vol. 1741). American Institute of Physics Inc.. https://doi.org/10.1063/1.4952850

Gofron, K. J. ; Cai, Y. Q. ; Coburn, D. S. et al. / On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. editor / Oleg Chubar ; Ignace Jarrige ; Konstantine Kaznatcheev ; Lisa Miller ; Eli Stavitski ; Toshiya Tanabe ; Timur Shaftan ; Qun Shen ; Ronald Pindak ; Christie Nelson ; Sebastian Kalbfleisch ; Juergen Thieme ; Garth Williams ; Martin Fuchs ; Abdul Rumaiz ; Jun Wang ; Kenneth Evans-Lutterodt ; Wah-Keat Lee ; Sean McSweeney ; Elio Vescovo. American Institute of Physics Inc., 2016. (AIP Conference Proceedings).

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title = "On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II",

abstract = "A novel on-axis X-ray microscope with 3 μm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.",

author = "Gofron, \{K. J.\} and Cai, \{Y. Q.\} and Coburn, \{D. S.\} and S. Antonelli and J. Flores and A. Suvorov",

note = "Publisher Copyright: {\textcopyright} 2016 Author(s).; 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 ; Conference date: 06-07-2015 Through 10-07-2015",

year = "2016",

month = jul,

day = "27",

doi = "10.1063/1.4952850",

language = "English",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

editor = "Oleg Chubar and Ignace Jarrige and Konstantine Kaznatcheev and Lisa Miller and Eli Stavitski and Toshiya Tanabe and Timur Shaftan and Qun Shen and Ronald Pindak and Christie Nelson and Sebastian Kalbfleisch and Juergen Thieme and Garth Williams and Martin Fuchs and Abdul Rumaiz and Jun Wang and Kenneth Evans-Lutterodt and Wah-Keat Lee and Sean McSweeney and Elio Vescovo",

booktitle = "Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015",

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Gofron, KJ, Cai, YQ, Coburn, DS, Antonelli, S, Flores, J & Suvorov, A 2016, On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. in O Chubar, I Jarrige, K Kaznatcheev, L Miller, E Stavitski, T Tanabe, T Shaftan, Q Shen, R Pindak, C Nelson, S Kalbfleisch, J Thieme, G Williams, M Fuchs, A Rumaiz, J Wang, K Evans-Lutterodt, W-K Lee, S McSweeney & E Vescovo (eds), Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015., 030027, AIP Conference Proceedings, vol. 1741, American Institute of Physics Inc., 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015, New York, United States, 07/6/15. https://doi.org/10.1063/1.4952850

On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. / Gofron, K. J.; Cai, Y. Q.; Coburn, D. S. et al.
Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. ed. / Oleg Chubar; Ignace Jarrige; Konstantine Kaznatcheev; Lisa Miller; Eli Stavitski; Toshiya Tanabe; Timur Shaftan; Qun Shen; Ronald Pindak; Christie Nelson; Sebastian Kalbfleisch; Juergen Thieme; Garth Williams; Martin Fuchs; Abdul Rumaiz; Jun Wang; Kenneth Evans-Lutterodt; Wah-Keat Lee; Sean McSweeney; Elio Vescovo. American Institute of Physics Inc., 2016. 030027 (AIP Conference Proceedings; Vol. 1741).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II

AU - Gofron, K. J.

AU - Cai, Y. Q.

AU - Coburn, D. S.

AU - Antonelli, S.

AU - Flores, J.

AU - Suvorov, A.

PY - 2016/7/27

Y1 - 2016/7/27

N2 - A novel on-axis X-ray microscope with 3 μm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.

AB - A novel on-axis X-ray microscope with 3 μm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.

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U2 - 10.1063/1.4952850

DO - 10.1063/1.4952850

M3 - Conference contribution

AN - SCOPUS:84984552615

T3 - AIP Conference Proceedings

BT - Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015

A2 - Chubar, Oleg

A2 - Jarrige, Ignace

A2 - Kaznatcheev, Konstantine

A2 - Miller, Lisa

A2 - Stavitski, Eli

A2 - Tanabe, Toshiya

A2 - Shaftan, Timur

A2 - Shen, Qun

A2 - Pindak, Ronald

A2 - Nelson, Christie

A2 - Kalbfleisch, Sebastian

A2 - Thieme, Juergen

A2 - Williams, Garth

A2 - Fuchs, Martin

A2 - Rumaiz, Abdul

A2 - Wang, Jun

A2 - Evans-Lutterodt, Kenneth

A2 - Lee, Wah-Keat

A2 - McSweeney, Sean

A2 - Vescovo, Elio

PB - American Institute of Physics Inc.

T2 - 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015

Y2 - 6 July 2015 through 10 July 2015

ER -

Gofron KJ, Cai YQ, Coburn DS, Antonelli S, Flores J, Suvorov A. On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II. In Chubar O, Jarrige I, Kaznatcheev K, Miller L, Stavitski E, Tanabe T, Shaftan T, Shen Q, Pindak R, Nelson C, Kalbfleisch S, Thieme J, Williams G, Fuchs M, Rumaiz A, Wang J, Evans-Lutterodt K, Lee WK, McSweeney S, Vescovo E, editors, Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. American Institute of Physics Inc. 2016. 030027. (AIP Conference Proceedings). doi: 10.1063/1.4952850

On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II

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