Normalized contact force to minimize "electrode-lead" resistance in a nanodevice

Seung Hoon Lee, Jun Bae, Seung Woo Lee, Jae Won Jang

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

In this report, the contact resistance between "electrode" and "lead" is investigated for reasonable measurements of samples' resistance in a polypyrrole (PPy) nanowire device. The sample's resistance, including "electrode- lead" contact resistance, shows a decrease as force applied to the interface increases. Moreover, the sample's resistance becomes reasonably similar to, or lower than, values calculated by resistivity of PPy reported in previous studies. The decrease of electrode-lead contact resistance by increasing the applying force was analyzed by using Holm theory: the general equation of relation between contact resistance (RH) of two-metal thin films and contact force (RH∝ √F). The present investigation can guide a reliable way to minimize electrode-lead contact resistance for reasonable characterization of nanomaterials in a microelectrode device; 80% of the maximum applying force to the junction without deformation of the apparatus shows reasonable values without experimental error.

Original languageEnglish
Pages (from-to)2415-2418
Number of pages4
JournalBulletin of the Korean Chemical Society
Volume35
Issue number8
DOIs
StatePublished - Aug 20 2014
Externally publishedYes

Keywords

  • Ag paste
  • Contact force
  • Contact resistance
  • Electrode-lead contact
  • Holm theory

Fingerprint

Dive into the research topics of 'Normalized contact force to minimize "electrode-lead" resistance in a nanodevice'. Together they form a unique fingerprint.

Cite this