Abstract
Tip-enhanced Raman spectroscopy (TERS) has been established as one the most efficient analytical techniques for probing vibrational states with nanoscale resolution. While TERS may be a source of unique information about chemical structure and interactions, it has a limited use for materials with rough or sticky surfaces. Development of the TERS approach utilizing a non-contact scanning probe microscopy mode can significantly extend the number of applications. Here we demonstrate a proof of the concept and feasibility of a non-contact TERS approach and test it on various materials. Our experiments show that non-contact TERS can provide 10 nm spatial resolution and a Raman signal enhancement factor of 105, making it very promising for chemical imaging of materials with high aspect ratio surface patterns and biomaterials.
Original language | English |
---|---|
Pages (from-to) | 3392-3399 |
Number of pages | 8 |
Journal | Nanoscale Advances |
Volume | 1 |
Issue number | 9 |
DOIs | |
State | Published - 2019 |
Funding
This work was supported by Laboratory Directed Research and Development program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. Department of Energy. D. V., V. B., A. K. and A. P. S. thanks the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science & Engineering Division for partial nancial support. G. P. acknowledges nancial support by the U.S. Department of Energy's Office of Vehicle Technologies. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is a U.S. Department of Energy Office of Science User Facility. Oak Ridge National Laboratory is operated for the U.S. Department of Energy by UT-Battelle under contract no. DE-AC05-00OR22725.