Noise Behavior of MOSFETs Fabricated in 0.5μm Fully-Depleted (FD) Silicon-on-Sapphire (SOS) CMOS in Weak, Moderate, and Strong Inversion

M. N. Ericson, C. L. Britton, J. M. Rochelle, B. J. Blalock, D. M. Binkley, A. L. Wintenberg, B. D. Williamson

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

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