Nitric oxide restrain root growth by DNA damage induced cell cycle arrest in Arabidopsis thaliana

Sulan Bai; Miaomiao Li; Tao Yao; Hui Wang; Yaochuan Zhang; Lihong Xiao; Jinzheng Wang; Zhen Zhang; Yong Hu; Weizhong Liu; Yikun He

doi:10.1016/j.niox.2011.12.001

Nitric oxide restrain root growth by DNA damage induced cell cycle arrest in Arabidopsis thaliana

Sulan Bai, Miaomiao Li, Tao Yao, Hui Wang, Yaochuan Zhang, Lihong Xiao, Jinzheng Wang, Zhen Zhang, Yong Hu, Weizhong Liu, Yikun He

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

Nitric oxide (NO) participates in the regulation of diverse functions in plant cells. However, different NO concentrations may trigger different pathways during the plant development. At basal levels of NO, plants utilize the NO signaling transduction pathway to facilitate plant growth and development, whereas higher concentrations trigger programmed cell death (PCD). Our results show that NO lower than the levels causing PCD, but higher than the basal levels induce DNA damage in root cells in Arabidopsis as witnessed by a reduction in root growth, rather than cell death, since cells retain the capacity to differentiate root hairs. The decrease in meristematic cells and increase in DNA damage signals in roots in responses to NO are in a dose dependent manner. The restraint of root growth is due to cell cycle arrest at G1 phase which is caused by NO induced DNA damage, besides a second arrest at G2/M existed in NO supersensitive mutant cue1. The results indicate that NO restrain root growth via DNA damage induced cell cycle arrest.

Original language	English
Pages (from-to)	54-60
Number of pages	7
Journal	Nitric Oxide - Biology and Chemistry
Volume	26
Issue number	1
DOIs	https://doi.org/10.1016/j.niox.2011.12.001
State	Published - Jan 1 2012
Externally published	Yes

Funding

We thank Dr. Tobias Baskin at Department of Biology, University of Massachusetts for the critical reading and commenting on this manuscript. This research work was supported by Natural Science Foundation of China (No. 30771094 ), Beijing Natural Science Foundation (Nos. 5082003 , 5112006 ) and The National Key Scientific Program-Nanoscience and Nanotechnology (No. 2007CB948201 to He).

Funders	Funder number
National Key Scientific Program-Nanoscience and Nanotechnology	2007CB948201
National Natural Science Foundation of China	30771094
Natural Science Foundation of Beijing Municipality	5082003, 5112006

Keywords

Cell-cycle response
Cue1
DNA damage
NO
Root growth

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10.1016/j.niox.2011.12.001

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@article{ec4730bedd4646ad8cce242689904c08,

title = "Nitric oxide restrain root growth by DNA damage induced cell cycle arrest in Arabidopsis thaliana",

abstract = "Nitric oxide (NO) participates in the regulation of diverse functions in plant cells. However, different NO concentrations may trigger different pathways during the plant development. At basal levels of NO, plants utilize the NO signaling transduction pathway to facilitate plant growth and development, whereas higher concentrations trigger programmed cell death (PCD). Our results show that NO lower than the levels causing PCD, but higher than the basal levels induce DNA damage in root cells in Arabidopsis as witnessed by a reduction in root growth, rather than cell death, since cells retain the capacity to differentiate root hairs. The decrease in meristematic cells and increase in DNA damage signals in roots in responses to NO are in a dose dependent manner. The restraint of root growth is due to cell cycle arrest at G1 phase which is caused by NO induced DNA damage, besides a second arrest at G2/M existed in NO supersensitive mutant cue1. The results indicate that NO restrain root growth via DNA damage induced cell cycle arrest.",

keywords = "Cell-cycle response, Cue1, DNA damage, NO, Root growth",

author = "Sulan Bai and Miaomiao Li and Tao Yao and Hui Wang and Yaochuan Zhang and Lihong Xiao and Jinzheng Wang and Zhen Zhang and Yong Hu and Weizhong Liu and Yikun He",

year = "2012",

month = jan,

day = "1",

doi = "10.1016/j.niox.2011.12.001",

language = "English",

volume = "26",

pages = "54--60",

journal = "Nitric Oxide - Biology and Chemistry",

issn = "1089-8603",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Nitric oxide restrain root growth by DNA damage induced cell cycle arrest in Arabidopsis thaliana

AU - Bai, Sulan

AU - Li, Miaomiao

AU - Yao, Tao

AU - Wang, Hui

AU - Zhang, Yaochuan

AU - Xiao, Lihong

AU - Wang, Jinzheng

AU - Zhang, Zhen

AU - Hu, Yong

AU - Liu, Weizhong

AU - He, Yikun

PY - 2012/1/1

Y1 - 2012/1/1

N2 - Nitric oxide (NO) participates in the regulation of diverse functions in plant cells. However, different NO concentrations may trigger different pathways during the plant development. At basal levels of NO, plants utilize the NO signaling transduction pathway to facilitate plant growth and development, whereas higher concentrations trigger programmed cell death (PCD). Our results show that NO lower than the levels causing PCD, but higher than the basal levels induce DNA damage in root cells in Arabidopsis as witnessed by a reduction in root growth, rather than cell death, since cells retain the capacity to differentiate root hairs. The decrease in meristematic cells and increase in DNA damage signals in roots in responses to NO are in a dose dependent manner. The restraint of root growth is due to cell cycle arrest at G1 phase which is caused by NO induced DNA damage, besides a second arrest at G2/M existed in NO supersensitive mutant cue1. The results indicate that NO restrain root growth via DNA damage induced cell cycle arrest.

AB - Nitric oxide (NO) participates in the regulation of diverse functions in plant cells. However, different NO concentrations may trigger different pathways during the plant development. At basal levels of NO, plants utilize the NO signaling transduction pathway to facilitate plant growth and development, whereas higher concentrations trigger programmed cell death (PCD). Our results show that NO lower than the levels causing PCD, but higher than the basal levels induce DNA damage in root cells in Arabidopsis as witnessed by a reduction in root growth, rather than cell death, since cells retain the capacity to differentiate root hairs. The decrease in meristematic cells and increase in DNA damage signals in roots in responses to NO are in a dose dependent manner. The restraint of root growth is due to cell cycle arrest at G1 phase which is caused by NO induced DNA damage, besides a second arrest at G2/M existed in NO supersensitive mutant cue1. The results indicate that NO restrain root growth via DNA damage induced cell cycle arrest.

KW - Cell-cycle response

KW - Cue1

KW - DNA damage

KW - NO

KW - Root growth

UR - http://www.scopus.com/inward/record.url?scp=84855163218&partnerID=8YFLogxK

U2 - 10.1016/j.niox.2011.12.001

DO - 10.1016/j.niox.2011.12.001

M3 - Article

C2 - 22197746

AN - SCOPUS:84855163218

SN - 1089-8603

VL - 26

SP - 54

EP - 60

JO - Nitric Oxide - Biology and Chemistry

JF - Nitric Oxide - Biology and Chemistry

IS - 1

ER -

Nitric oxide restrain root growth by DNA damage induced cell cycle arrest in Arabidopsis thaliana

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