New results from performance studies of frisch-grid CdZnTe detectors

A. E. Bolotnikov; G. S. Camarda; G. A. Carini; G. W. Wright; D. S. McGregor; W. McNeil; R. B. James

doi:10.1117/12.563393

New results from performance studies of frisch-grid CdZnTe detectors

A. E. Bolotnikov, G. S. Camarda, G. A. Carini, G. W. Wright, D. S. McGregor, W. McNeil, R. B. James

Research output: Contribution to journal › Conference article › peer-review

20 Scopus citations

Abstract

New data regarding performance studies of Frisch-grid CdZnTe (CZT) detectors are presented The Frisch-grid detector configuration under investigation is a bar shaped CZT crystal with the side surfaces coated with an insulating layer. A Frisch grid is fashioned by inserting the CZT bar into a metallic sleeve, or by depositing the metal directly upon the insulator; hence the semiconductor material does not come in contact with the metal grid. The simple design operates well as a single-carrier-sensitive device. Despite the simplicity of this device, its performance depends on the balanced combinations of several factors, including the bulk and surface conductivity, μτ product, and geometrical aspect ratio. Described are several effects that determine charge collection in such drift devices and, consequently, the performance of the non-contacting Frisch-grid configuration.

Original language	English
Article number	04
Pages (from-to)	33-45
Number of pages	13
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5540
DOIs	https://doi.org/10.1117/12.563393
State	Published - 2004
Externally published	Yes
Event	Hard X-Ray and Gamma-Ray Detector Physics VI - Denver, CO, United States Duration: Aug 2 2004 → Aug 3 2004

Keywords

CdZnTe
Frisch-grid
Gamma-ray detectors

Access to Document

10.1117/12.563393

Cite this

@article{da25f0d9e3e3487095a25087cae3def0,

title = "New results from performance studies of frisch-grid CdZnTe detectors",

abstract = "New data regarding performance studies of Frisch-grid CdZnTe (CZT) detectors are presented The Frisch-grid detector configuration under investigation is a bar shaped CZT crystal with the side surfaces coated with an insulating layer. A Frisch grid is fashioned by inserting the CZT bar into a metallic sleeve, or by depositing the metal directly upon the insulator; hence the semiconductor material does not come in contact with the metal grid. The simple design operates well as a single-carrier-sensitive device. Despite the simplicity of this device, its performance depends on the balanced combinations of several factors, including the bulk and surface conductivity, μτ product, and geometrical aspect ratio. Described are several effects that determine charge collection in such drift devices and, consequently, the performance of the non-contacting Frisch-grid configuration.",

keywords = "CdZnTe, Frisch-grid, Gamma-ray detectors",

author = "Bolotnikov, {A. E.} and Camarda, {G. S.} and Carini, {G. A.} and Wright, {G. W.} and McGregor, {D. S.} and W. McNeil and James, {R. B.}",

year = "2004",

doi = "10.1117/12.563393",

language = "English",

volume = "5540",

pages = "33--45",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "Society of Photo-Optical Instrumentation Engineers",

note = "Hard X-Ray and Gamma-Ray Detector Physics VI ; Conference date: 02-08-2004 Through 03-08-2004",

}

TY - JOUR

T1 - New results from performance studies of frisch-grid CdZnTe detectors

AU - Bolotnikov, A. E.

AU - Camarda, G. S.

AU - Carini, G. A.

AU - Wright, G. W.

AU - McGregor, D. S.

AU - McNeil, W.

AU - James, R. B.

PY - 2004

Y1 - 2004

N2 - New data regarding performance studies of Frisch-grid CdZnTe (CZT) detectors are presented The Frisch-grid detector configuration under investigation is a bar shaped CZT crystal with the side surfaces coated with an insulating layer. A Frisch grid is fashioned by inserting the CZT bar into a metallic sleeve, or by depositing the metal directly upon the insulator; hence the semiconductor material does not come in contact with the metal grid. The simple design operates well as a single-carrier-sensitive device. Despite the simplicity of this device, its performance depends on the balanced combinations of several factors, including the bulk and surface conductivity, μτ product, and geometrical aspect ratio. Described are several effects that determine charge collection in such drift devices and, consequently, the performance of the non-contacting Frisch-grid configuration.

AB - New data regarding performance studies of Frisch-grid CdZnTe (CZT) detectors are presented The Frisch-grid detector configuration under investigation is a bar shaped CZT crystal with the side surfaces coated with an insulating layer. A Frisch grid is fashioned by inserting the CZT bar into a metallic sleeve, or by depositing the metal directly upon the insulator; hence the semiconductor material does not come in contact with the metal grid. The simple design operates well as a single-carrier-sensitive device. Despite the simplicity of this device, its performance depends on the balanced combinations of several factors, including the bulk and surface conductivity, μτ product, and geometrical aspect ratio. Described are several effects that determine charge collection in such drift devices and, consequently, the performance of the non-contacting Frisch-grid configuration.

KW - CdZnTe

KW - Frisch-grid

KW - Gamma-ray detectors

UR - http://www.scopus.com/inward/record.url?scp=15844415646&partnerID=8YFLogxK

U2 - 10.1117/12.563393

DO - 10.1117/12.563393

M3 - Conference article

AN - SCOPUS:15844415646

SN - 0277-786X

VL - 5540

SP - 33

EP - 45

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 04

T2 - Hard X-Ray and Gamma-Ray Detector Physics VI

Y2 - 2 August 2004 through 3 August 2004

ER -

New results from performance studies of frisch-grid CdZnTe detectors

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this