Abstract
The branching ratio, the photoemission intensity ratio of two spin-orbit-split components, has been applied for the first time as a means for obtaining a photoelectron holographic image. Angle-resolved photoemission from a monolayer of Bi adsorbed on Si(111) shows fine-structure oscillations in the branching ratio of the Bi 5d core level due to diffraction effects. These oscillations as a function of photon energy are recorded for a number of emission angles. Three-dimensional holographic inversion of the data yields an atomic image which shows that the Bi adatoms are arranged in a trimer structure.
| Original language | English |
|---|---|
| Pages (from-to) | L485-L490 |
| Journal | Surface Science |
| Volume | 380 |
| Issue number | 2-3 |
| DOIs | |
| State | Published - May 15 1997 |
| Externally published | Yes |
Funding
This work was supportedb y the US Department of Energy (Division of Materials Sciences, Office of Basic Energy Sciencest Grant No. DEFG02-91ER45439T.h e SynchrotroRn adiation Centero f the Universityo f Wisconsin--Madisoisn supportebdy the US NationalS cienceF oundation Grant No. DMR-92-12658. Acknowledgement is also made to the Donors of the Petroleum ResearchF und, administeredb y the American ChemicaSl ocietya, nd to the US NationalS cience Foundation Grants Nos. DMR 95-31809a nd 95-31582fo r partialp ersonnealn de quipmenstu p-port in connectiown ith the synchrotrobne amline operation.
| Funders | Funder number |
|---|---|
| American ChemicaSl ocietya | |
| Office of Basic Energy Sciencest | |
| US Department of Energy | |
| US NationalS cience Foundation | |
| US NationalS cienceF oundation | |
| Division of Materials Sciences and Engineering |
Keywords
- Angle resolved photoemission
- Bismuth
- Photoelectron holography
- Silicon
- Single crystal surfaces
- Soft X-ray photoelectron spectroscopy (using synchrotron radiation)
- Surface structure, morphology, roughness, and topography