@inproceedings{bca823f9c0e0498ea8a719c9a4a68e61,
title = "Near field microwave microscopy for nanoscale characterization, imaging and patterning of graphene",
abstract = "This paper reports images of reproducible nanopatterns on hexagonal graphene flakes, produced by modulating the input power of a Near-Field Scanning Microwave Microscope, used at the same time for the characterization of the samples. We have studied the impact of different time exposures to the microwave field, and of different power levels. A possible explanation of the patterning mechanism is given by the heating-induced oxidation of the exposed graphene flakes. In order to confirm this assumption, we have developed a simplified model for the analysis of the heat distribution, and for the estimation of the temperature under the microscope probe. This effect could be the basis for an alternative nanolithographic technique.",
keywords = "Graphene, Nanolithography, Nanopatterning, Scanning Probe Microscopy",
author = "Tamara Monti and {Di Donato}, Andrea and Davide Mencarelli and Giuseppe Venanzoni and Antonio Morini and Marco Farina and Vlassiouk, {Ivan V.} and Alexander Tselev",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 4th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014 ; Conference date: 27-10-2014 Through 31-10-2014",
year = "2014",
month = mar,
day = "9",
doi = "10.1109/3M-NANO.2014.7057298",
language = "English",
series = "2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014 - Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "32--38",
editor = "Pasi Kallio",
booktitle = "2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014 - Conference Proceedings",
}