Near-edge X-ray absorption fine structure spectroscopy as a tool for investigating nanomaterials

Tirandai Hemraj-Benny, Sarbajit Banerjee, Sharadha Sambasivan, Mahalingam Balasubramanian, Daniel A. Fischer, Gyula Eres, Alexander A. Puretzky, David B. Geohegan, Douglas H. Lowndes, Weiqiang Han, James A. Misewich, Stanislaus S. Wong

Research output: Contribution to journalArticlepeer-review

150 Scopus citations

Abstract

We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single-walled carbon nanotube and multi-walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages of NEXAFS as an exciting, complementary tool to conventional microscopy and spectroscopy for providing chemical and structural information about nanoscale samples.

Original languageEnglish
Pages (from-to)26-35
Number of pages10
JournalSmall
Volume2
Issue number1
DOIs
StatePublished - Jan 2006

Keywords

  • Carbon nanotubes
  • Functionalization
  • NEXAFS spectroscopy
  • Nanomaterials
  • Surface analysis

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