Nanoscale strain distribution at the Ag/Ru(0001) interface

H. Zajonz, Doon Gibbs, A. P. Baddorf, D. M. Zehner

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We present an x-ray scattering study of the structure and strain distribution of the orthorhombic (formula presented) reconstruction of a one monolayer Ag film grown on Ru(0001) at (formula presented) The application of very-fast simulated annealing algorithms to the measured x-ray intensities leads to a model in which the Ag film forms a two-dimensionally modulated hexagonal network of dislocations separating smaller patches of ideal hcp and faulted fcc adlayer stacking. Calculations of the in-plane strain distribution based on the model reveal a simple stripelike structure with a 4.5-nm periodicity, reminiscent of what is observed on Cu/Ru(0001).

Original languageEnglish
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume67
Issue number15
DOIs
StatePublished - Apr 30 2003

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