Nanoscale Measurement and Manipulation of Exciton Species in Monolayer Semiconductors

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We use cryogenic cathodoluminescence microscopy with in-situ gating and e-beam patterning to probe the effects of nanoscale variations in strain, doping, and defects on exciton species in hBN-encapsulated WSe2.

Original languageEnglish
Title of host publication2025 Conference on Lasers and Electro-Optics, CLEO 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171500
StatePublished - 2025
Event2025 Conference on Lasers and Electro-Optics, CLEO 2025 - Long Beach, United States
Duration: May 4 2025May 9 2025

Publication series

Name2025 Conference on Lasers and Electro-Optics, CLEO 2025

Conference

Conference2025 Conference on Lasers and Electro-Optics, CLEO 2025
Country/TerritoryUnited States
CityLong Beach
Period05/4/2505/9/25

Funding

This research was sponsored by the U. S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. The CL microscopy was supported by the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. Student support was provided by the U.S. Department of Energy, Office of Science, Office of Workforce Development for Teachers and Scientists (WDTS) under the Science Undergraduate Laboratory Internship program.

Fingerprint

Dive into the research topics of 'Nanoscale Measurement and Manipulation of Exciton Species in Monolayer Semiconductors'. Together they form a unique fingerprint.

Cite this