Nanoscale Combined Optical Measurements of 2D Chalcogenides in van der Waals heterostructures using Cathodoluminescence and Electron Energy Loss Spectroscopy in SEM and STEM

Noémie Bonnet, Jassem Baaboura, Florian Castioni, Steffi Y. Woo, Ching Hwa Ho, Kenji Watanabe, Takashi Taniguchi, Luiz H.G. Tizei, Toon Coenen

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)1122-1123
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

The authors acknowledge funding from the TEMPOS-CHROMATEM, JCJC SpinE, ESTEEM3, JSPS KAKENHI, WPI MEXT, FET Proactive EBEAM grants. M Kociak and A Polman are thanked for their useful contributions to this work. N B and T C are employed by Delmic B V, a company that builds instrumentation for cathodoluminescence microscopy in scanning electron microscopes.

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