Nanodielectrics for cryogenic applications

Enis Tuncer; Isidor Sauers; D. Randy James; Alvin R. Ellis; Marshall Pace; Karren L. More; Srivatsan Sathyamurthy; Jonathan Woodward; Adam J. Rondinone

doi:10.1109/TASC.2009.2018198

Nanodielectrics for cryogenic applications

Enis Tuncer, Isidor Sauers, D. Randy James, Alvin R. Ellis, Marshall Pace, Karren L. More, Srivatsan Sathyamurthy, Jonathan Woodward, Adam J. Rondinone

Center for Nanophase Matls Sciences

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

In this paper we report the recent advances in nanodielectrics that were developed and tested for cryogenic dielectric applications. The systems studied are composed of nanometer size particles. Particles were produced using either an ex-situ or in-situ technique. It is observed that there are clear differences in the structural properties of materials produced using these two approaches. Either no significant degradation or improvement in the electrical insulation properties were observed for ex-situ nano-particle samples processed with an ultrasonic processor and in-situ nano-particle samples. Nanodielectrics have the potential to be tailored with better thermal and mechanical properties without losing their electrical insulation characteristics.

Original language	English
Article number	5129256
Pages (from-to)	2354-2358
Number of pages	5
Journal	IEEE Transactions on Applied Superconductivity
Volume	19
Issue number	3
DOIs	https://doi.org/10.1109/TASC.2009.2018198
State	Published - Jun 2009

Funding

Manuscript received August 16, 2008. First published June 26, 2009; current version published July 15, 2009. Research sponsored by the US Department of Energy-Office of Electricity Delivery and Energy Reliability, Superconductivity Program for Electric Power Systems Contract DE-AC05-00OR22725 with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC.

Funders	Funder number
US Department of Energy-Office of Electricity Delivery and Energy	DE-AC05-00OR22725
Oak Ridge National Laboratory

Keywords

Cryogenic dielectrics
Nanodielectrics
Structural characterization

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10.1109/TASC.2009.2018198

Cite this

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AU - Woodward, Jonathan

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Nanodielectrics for cryogenic applications

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