Nano-scale 3D metrology for surface characterization and inspection of high-precision manufactured components

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	779
Number of pages	1
Journal	Transactions of the American Nuclear Society
Volume	97
State	Published - 2007
Externally published	Yes
Event	2007 Winter Meeting on International Conference on Making the Renaissance Real - Washington, DC, United States Duration: Nov 11 2007 → Nov 15 2007

Cite this

@article{54e74e4588424f229b3c0ef07890c828,

title = "Nano-scale 3D metrology for surface characterization and inspection of high-precision manufactured components",

author = "W. Hao and S. Huq and D. Page and B. Abidi and A. Koschan and M. Abidi",

year = "2007",

language = "English",

volume = "97",

pages = "779",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

note = "2007 Winter Meeting on International Conference on Making the Renaissance Real ; Conference date: 11-11-2007 Through 15-11-2007",

}

TY - JOUR

T1 - Nano-scale 3D metrology for surface characterization and inspection of high-precision manufactured components

AU - Hao, W.

AU - Huq, S.

AU - Page, D.

AU - Abidi, B.

AU - Koschan, A.

AU - Abidi, M.

PY - 2007

Y1 - 2007

UR - https://www.scopus.com/pages/publications/55349106529

M3 - Conference article

AN - SCOPUS:55349106529

SN - 0003-018X

VL - 97

SP - 779

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - 2007 Winter Meeting on International Conference on Making the Renaissance Real

Y2 - 11 November 2007 through 15 November 2007

ER -