Multiply-charged argon ion irradiation of microfabricated niobium wires

While rare on Earth, multiply-charged ions (MCIs) are abundant species in outer space. For spacecraft outside the Earth's atmosphere, MCIs are some of the main contributors to the failure of electronic devices. While the detrimental effects of MCIs on space electronics have been known for quite some time, the underlying physics of their interactions, which are tied to the coupling of both electronic and lattice degrees of freedom, are complex and remain relatively unexplored. The impacts of MCIs on superconducting electronics used for detection and communication in outer space are particularly unknown. Here, we aim to shed light on such interactions by examining the effect of low- to medium-dose Ar⁸⁺ irradiation on the physical characteristics (e.g., surface topography, electrical transport) of microfabricated niobium (Nb) wires.