mpfit: a robust method for fitting atomic resolution images with multiple Gaussian peaks

Debangshu Mukherjee, Leixin Miao, Greg Stone, Nasim Alem

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Fingerprint

Dive into the research topics of 'mpfit: a robust method for fitting atomic resolution images with multiple Gaussian peaks'. Together they form a unique fingerprint.

Engineering

Physics

Material Science