Abstract
We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile.
| Original language | English |
|---|---|
| Pages (from-to) | 538-541 |
| Number of pages | 4 |
| Journal | Physica B: Condensed Matter |
| Volume | 221 |
| Issue number | 1-4 |
| DOIs | |
| State | Published - Apr 2 1996 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Moments analysis of X-ray reflection profiles'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver