Moments analysis of X-ray reflection profiles

F. Rieutord; A. Braslau; R. Simon; H. J. Lauter; V. Pasyuk

doi:10.1016/0921-4526(95)00977-9

Moments analysis of X-ray reflection profiles

F. Rieutord, A. Braslau, R. Simon, H. J. Lauter, V. Pasyuk

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile.

Original language	English
Pages (from-to)	538-541
Number of pages	4
Journal	Physica B: Physics of Condensed Matter
Volume	221
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4526(95)00977-9
State	Published - Apr 2 1996
Externally published	Yes

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@article{893f639f43bc4a869b7522f447f046d9,

title = "Moments analysis of X-ray reflection profiles",

abstract = "We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile.",

author = "F. Rieutord and A. Braslau and R. Simon and Lauter, {H. J.} and V. Pasyuk",

year = "1996",

month = apr,

day = "2",

doi = "10.1016/0921-4526(95)00977-9",

language = "English",

volume = "221",

pages = "538--541",

journal = "Physica B: Physics of Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier",

number = "1-4",

}

TY - JOUR

T1 - Moments analysis of X-ray reflection profiles

AU - Rieutord, F.

AU - Braslau, A.

AU - Simon, R.

AU - Lauter, H. J.

AU - Pasyuk, V.

PY - 1996/4/2

Y1 - 1996/4/2

N2 - We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile.

AB - We discuss an approach towards understanding the limitations of X-ray or neutron reflectivity methods for the determination of an interfacial density profile. A novel analysis is presented based on an expansion of the reflectivity function in terms of moments of the density profile.

UR - http://www.scopus.com/inward/record.url?scp=0030562953&partnerID=8YFLogxK

U2 - 10.1016/0921-4526(95)00977-9

DO - 10.1016/0921-4526(95)00977-9

M3 - Article

AN - SCOPUS:0030562953

SN - 0921-4526

VL - 221

SP - 538

EP - 541

JO - Physica B: Physics of Condensed Matter

JF - Physica B: Physics of Condensed Matter

IS - 1-4

ER -

Moments analysis of X-ray reflection profiles

Abstract

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