Molten Salt Loop Testing of Sensors and Off-Gas Components: FY23 progress

Kevin Robb, Ethan Kappes, Daniel Orea

Research output: Book/ReportCommissioned report

Abstract

The Liquid Salt Test Loop (LSTL) at the US Department of Energy’s (DOE’s) Oak Ridge National Laboratory (ORNL) was developed to demonstrate technology for high-temperature fluoride salt systems (Figure 1). The LSTL is primarily constructed using Inconel 600 alloy and operates at temperatures of up to 700°C. The facility is loaded with 165 kg of LiF-NaF-KF salt (FLiNaK). This salt provides a relevant test environment for de-risking technology while avoiding the costs and hazards associated with beryllium-based or uranium-bearing salts. FLiNaK is also an advantageous salt for the secondary side of molten salt reactors. The facility’s major components include a centrifugal pump for salt circulation, an air-based heat exchanger to reject heat, a suite of instrumentation, and trace heating to prevent salt freezing. Additional heating is available through an induction heater rated at 200 kW. The relatively large heating and cooling capability enables the formation of a temperature gradient across the loop (i.e., a hot and a cold side), which is important for chemistry and corrosion studies. The LSTL is a unique US capability for high-temperature molten halide salt testing. Although some efforts are underway at universities, the LSTL’s scale, co-located purification system, and relatively large power differentiates it from other testing systems. Furthermore, unlike efforts within industry, access to the DOE-supported facility and communication of results, which are generally disseminated publicly, result in a broad significance in the molten salt reactor community.
Original languageEnglish
Place of PublicationUnited States
DOIs
StatePublished - 2023

Keywords

  • 22 GENERAL STUDIES OF NUCLEAR REACTORS

Fingerprint

Dive into the research topics of 'Molten Salt Loop Testing of Sensors and Off-Gas Components: FY23 progress'. Together they form a unique fingerprint.

Cite this