Models for Resilience Design Patterns

Mohit Kumar; Christian Engelmann

doi:10.1109/FTXS51974.2020.00008

Models for Resilience Design Patterns

Mohit Kumar, Christian Engelmann

Intelligent Systems and Facilities

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Resilience plays an important role in supercomputers by providing correct and efficient operation in case of faults, errors, and failures. Resilience design patterns offer blueprints for effectively applying resilience technologies. Prior work focused on developing initial efficiency and performance models for resilience design patterns. This paper extends it by (1) describing performance, reliability, and availability models for all structural resilience design patterns, (2) providing more detailed models that include flowcharts and state diagrams, and (3) introducing the Resilience Design Pattern Modeling (RDPM) tool that calculates and plots the performance, reliability, and availability metrics of individual patterns and pattern combinations.

Original language	English
Title of host publication	Proceedings of FTXS 2020
Subtitle of host publication	Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	21-30
Number of pages	10
ISBN (Electronic)	9781665422895
DOIs	https://doi.org/10.1109/FTXS51974.2020.00008
State	Published - Nov 2020
Event	10th IEEE/ACM Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS 2020 - Virtual, Atlanta, United States Duration: Nov 11 2020 → …

Publication series

Name	Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis

Conference

Conference	10th IEEE/ACM Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS 2020
Country/Territory	United States
City	Virtual, Atlanta
Period	11/11/20 → …

Funding

ACKNOWLEDGMENT This work was supported by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, Early Career Program, with program managers Robinson Pino and Lucy Nowell. This work was sponsored by the U.S. Department of Energy’s Office of Advanced Scientific Computing Research. This manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).

Funders	Funder number
U.S. Department of Energy
Office of Science
Advanced Scientific Computing Research	DE-AC05-00OR22725

Keywords

design patterns
high-performance computing
models
resilience

Access to Document

10.1109/FTXS51974.2020.00008

Cite this

Kumar, M., & Engelmann, C. (2020). Models for Resilience Design Patterns. In Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis (pp. 21-30). Article 9306940 (Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FTXS51974.2020.00008

Kumar, Mohit ; Engelmann, Christian. / Models for Resilience Design Patterns. Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis. Institute of Electrical and Electronics Engineers Inc., 2020. pp. 21-30 (Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis).

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abstract = "Resilience plays an important role in supercomputers by providing correct and efficient operation in case of faults, errors, and failures. Resilience design patterns offer blueprints for effectively applying resilience technologies. Prior work focused on developing initial efficiency and performance models for resilience design patterns. This paper extends it by (1) describing performance, reliability, and availability models for all structural resilience design patterns, (2) providing more detailed models that include flowcharts and state diagrams, and (3) introducing the Resilience Design Pattern Modeling (RDPM) tool that calculates and plots the performance, reliability, and availability metrics of individual patterns and pattern combinations.",

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Kumar, M & Engelmann, C 2020, Models for Resilience Design Patterns. in Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis., 9306940, Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis, Institute of Electrical and Electronics Engineers Inc., pp. 21-30, 10th IEEE/ACM Workshop on Fault Tolerance for HPC at eXtreme Scale, FTXS 2020, Virtual, Atlanta, United States, 11/11/20. https://doi.org/10.1109/FTXS51974.2020.00008

Models for Resilience Design Patterns. / Kumar, Mohit; Engelmann, Christian.
Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis. Institute of Electrical and Electronics Engineers Inc., 2020. p. 21-30 9306940 (Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Kumar M, Engelmann C. Models for Resilience Design Patterns. In Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis. Institute of Electrical and Electronics Engineers Inc. 2020. p. 21-30. 9306940. (Proceedings of FTXS 2020: Fault Tolerance for HPC at eXtreme Scale, Held in conjunction with SC 2020: The International Conference for High Performance Computing, Networking, Storage and Analysis). doi: 10.1109/FTXS51974.2020.00008

Models for Resilience Design Patterns

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