Abstract
During the operation of an x-ray device, high voltage stresses increase risk of dielectric breakdown. It is critically important that these systems are designed so that the magnitude of the electric field or the electric field stress are within the material limits for dielectric breakdown. In the present investigation, a simplified x-ray device is numerically modelled for two limiting cases with sharp edges and with perfectly-rounded edges to understand the numerical behavior of these solutions and to determine optimal geometry for minimizing electric field stress.
Original language | English |
---|---|
Pages (from-to) | 59-65 |
Number of pages | 7 |
Journal | Journal of Electrostatics |
Volume | 99 |
DOIs | |
State | Published - May 2019 |
Externally published | Yes |
Keywords
- Electric field singularities
- Electric field stress
- Electrostatics
- High voltage
- Numerical modelling
- X-ray