Abstract
Noisy intermediate-scale quantum (NISQ) devices offer unique platforms to test and evaluate the behavior of quantum computing. However, validating circuits on NISQ devices is difficult due to fluctuations in the underlying noise sources and other nonreproducible behaviors that generate computational errors. Here we present a test-driven approach that decomposes a noisy, application-specific circuit into a series of bootstrapped experiments on a NISQ device. By characterizing individual subcircuits, we generate a composite noise model for the original quantum circuit. We demonstrate this approach to model applications of Greenberger-Horne-Zeilinger(GHZ)-state preparation and the Bernstein-Vazirani algorithm on a family of superconducting transmon devices. We measure the model accuracy using the total variation distance between predicted and experimental results, and we demonstrate that the composite model works well across multiple circuit instances. Our approach is shown to be computationally efficient and offers a trade-off in model complexity that can be tailored to the desired predictive accuracy.
Original language | English |
---|---|
Article number | 042603 |
Journal | Physical Review A |
Volume | 103 |
Issue number | 4 |
DOIs | |
State | Published - Apr 2021 |
Funding
This manuscript has been co-authored by employees of UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the US Department of Energy. The U.S. Government retains, and the publisher, by accepting the article for publication, acknowledges that the U.S. Government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript or allow others to do so for U.S. Government purposes. This research is supported by the Department of Energy Office of Science Early Career Research Program and used resources of the Oak Ridge Leadership Computing Facility, which is a DOE Office of Science User Facility supported under Contract No. DE-AC05-00OR22725.