MOCVD growth and characterization of (BaxSr1-x)Ti1+yO3+z thin films for high frequency devices

P. K. Baumann, D. Y. Kaufman, S. K. Streiffer, J. Im, O. Auciello, R. A. Erck, J. Giumarra, J. Zebrowski, P. Baldo, A. McCormick

Research output: Contribution to journal › Conference article › peer-review

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