Misfit dislocations in ferroelectric thin films

M. Arredondo; M. Chi; M. Saunders; A. Petraru; V. Nagarajan; H. Kohlstedt; N. D. Browning

doi:10.1017/S1431927608082238

Misfit dislocations in ferroelectric thin films

M. Arredondo, M. Chi, M. Saunders, A. Petraru, V. Nagarajan, H. Kohlstedt, N. D. Browning

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	240-241
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608082238
State	Published - Aug 2008

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title = "Misfit dislocations in ferroelectric thin films",

author = "M. Arredondo and M. Chi and M. Saunders and A. Petraru and V. Nagarajan and H. Kohlstedt and Browning, \{N. D.\}",

year = "2008",

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language = "English",

volume = "14",

pages = "240--241",

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publisher = "Oxford University Press",

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TY - JOUR

T1 - Misfit dislocations in ferroelectric thin films

AU - Arredondo, M.

AU - Chi, M.

AU - Saunders, M.

AU - Petraru, A.

AU - Nagarajan, V.

AU - Kohlstedt, H.

AU - Browning, N. D.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549108223

U2 - 10.1017/S1431927608082238

DO - 10.1017/S1431927608082238

M3 - Article

AN - SCOPUS:49549108223

SN - 1431-9276

VL - 14

SP - 240

EP - 241

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Misfit dislocations in ferroelectric thin films

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