Minimum overlayer thickness for interface formation: An experimental study of the Cu/Ag/Cu(111) system

M. A. Mueller; E. S. Hirschorn; T. Miller; T. C. Chiang

doi:10.1103/PhysRevB.43.11825

Minimum overlayer thickness for interface formation: An experimental study of the Cu/Ag/Cu(111) system

M. A. Mueller, E. S. Hirschorn, T. Miller, T. C. Chiang

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9 Scopus citations

Abstract

The evolution of the electronic properties of the boundary between a solid (Ag) and an overlayer (Cu) as a function of the overlayer thickness is examined to yield the characteristic overlayer thickness for interface formation. The boundary properties are probed by measuring the reflection phase shifts of valence electrons using a quantum-well geometry.

Original language	English
Pages (from-to)	11825-11828
Number of pages	4
Journal	Physical Review B
Volume	43
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevB.43.11825
State	Published - 1991
Externally published	Yes

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10.1103/PhysRevB.43.11825

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title = "Minimum overlayer thickness for interface formation: An experimental study of the Cu/Ag/Cu(111) system",

abstract = "The evolution of the electronic properties of the boundary between a solid (Ag) and an overlayer (Cu) as a function of the overlayer thickness is examined to yield the characteristic overlayer thickness for interface formation. The boundary properties are probed by measuring the reflection phase shifts of valence electrons using a quantum-well geometry.",

author = "Mueller, {M. A.} and Hirschorn, {E. S.} and T. Miller and Chiang, {T. C.}",

year = "1991",

doi = "10.1103/PhysRevB.43.11825",

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AU - Miller, T.

AU - Chiang, T. C.

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AB - The evolution of the electronic properties of the boundary between a solid (Ag) and an overlayer (Cu) as a function of the overlayer thickness is examined to yield the characteristic overlayer thickness for interface formation. The boundary properties are probed by measuring the reflection phase shifts of valence electrons using a quantum-well geometry.

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U2 - 10.1103/PhysRevB.43.11825

DO - 10.1103/PhysRevB.43.11825

M3 - Article

AN - SCOPUS:0343135494

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SP - 11825

EP - 11828

JO - Physical Review B

JF - Physical Review B

IS - 14

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Minimum overlayer thickness for interface formation: An experimental study of the Cu/Ag/Cu(111) system

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